Subject of the project is a concept of utilization of the basic quality devices during monitoring of critical parameters of silicon monocrystals’ production.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:221766 |
| Date | January 2008 |
| Creators | Gálik, Petr |
| Contributors | Šišková, Věra, Videcká, Zdeňka |
| Publisher | Vysoké učení technické v Brně. Fakulta podnikatelská |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
Page generated in 0.002 seconds