Substrate-enhanced scattering-type scanning near-field infrared microscopy of nanoparticles

Description

Zugl.: München, Techn. Univ., Diss., 2009

Links & Downloads

1. http://d-nb.info/998908762/04

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/506484045
Date	January 2009
Creators	Cvitković, Antonija
Publisher	München Verl. Dr. Hut
Source Sets	OCLC
Language	English
Detected Language	English