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Návrh vhodného etalonu délky pro oblast nanometrologie na pracovištích ČMI Brno a CEITEC Brno / Design of a suitable length standard for nanometology at the CMI Brno and CEITEC Brno

The thesis deals with the design of a suitable length standard for nanometrology. This length standard will be used for metrological traceability of the Rigaku nano3DX located at CEITEC Brno and the SIOS NMM-1 device which is located at ČMI Brno. The first part is focused on the description of these measuring instruments, the analysis of their metrological traceability requirements and the requirements for the material length standard. The second part is devoted to the concrete possibilities of the etalon design, 3D printing of the prototype of the standard and verification of its dimensional compatibility. At the end of the thesis, the evaluation and selection of the appropriate standard design is made.

Identiferoai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:402562
Date January 2019
CreatorsČešek, Jakub
ContributorsJankových, Róbert, Šrámek, Jan
PublisherVysoké učení technické v Brně. Fakulta strojního inženýrství
Source SetsCzech ETDs
LanguageCzech
Detected LanguageEnglish
Typeinfo:eu-repo/semantics/masterThesis
Rightsinfo:eu-repo/semantics/restrictedAccess

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