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Structural and electrical characterization of highly oriented (KxNax)NbO3 (KNN) thin films by chemical solution deposition

Thesis--Auburn University, 2009. / Abstract. Vita. Includes bibliographical references (p. 77-82).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/325042755
Date January 2009
CreatorsKang, Chiwon, Kim, Dong Joo,
PublisherAuburn, Ala.,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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