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Metrology of gan electronics using micro-raman spectroscopy

Thesis (Ph.D)--Mechanical Engineering, Georgia Institute of Technology, 2009. / Committee Chair: Graham, Samuel; Committee Member: Bassiri-Gharb, Nazanin; Committee Member: Doolittle, William A.; Committee Member: Garimella, Srinivas; Committee Member: Green, Dan; Committee Member: Sitaraman, Suresh. Part of the SMARTech Electronic Thesis and Dissertation Collection.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/430197478
Date January 2008
CreatorsBeechem, Thomas E., III.
PublisherAtlanta, Ga. : Georgia Institute of Technology,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceAvailable online, Georgia Institute of Technology:

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