Characterize silicon wafers used in solar cell production with a NIR-LCI interferometer. The interferometer is further developed and measurements on silicon samples are carried out.
| Identifer | oai:union.ndltd.org:UPSALLA1/oai:DiVA.org:ntnu-13430 |
| Date | January 2011 |
| Creators | Simonsen, Ove |
| Publisher | Norges teknisk-naturvitenskapelige universitet, Institutt for elektronikk og telekommunikasjon, Institutt for elektronikk og telekommunikasjon |
| Source Sets | DiVA Archive at Upsalla University |
| Language | English |
| Detected Language | English |
| Type | Student thesis, info:eu-repo/semantics/bachelorThesis, text |
| Format | application/pdf |
| Rights | info:eu-repo/semantics/openAccess |
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