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Mean L-fluorescence yields and relative L x-ray intensities in the region Z = 55 to 65

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Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/27168
Date05 1900
CreatorsNix, Dale Wendel
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Detected LanguageEnglish
TypeThesis
RightsAccess restricted to authorized Georgia Tech users only.

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