This thesis deals with the possibilities of digital circuit test optimization using multifunctional logic gates. The most important part of this thesis is the explanation of the optimization principle, which is also described by a formal mathematical apparatus. Based on this apparatus, the work presents several options. The optimization of testability analogous to inserting test points and simple methodology based on SCOAP is shown. The focus of work is a methodology created to optimize circuit tests. It was implemented in the form of software tools. Presented in this work are the results of using these tools to reduce the test vectors volume while maintaining fault coverage on various circuits, including circuits from the ISCAS 85 test set. Part of the work is devoted to the various principles and technology of creating multifunctional logic gates. Some selected gates of these technologies are subject to simulations of electronic properties in SPICE. Based on the principles of presented methodology and results of multifunctional gates simulations, analysis of various problems such as validity of the modified circuit test and the suitability of each multifunctional gate technology for the methodology was also made. The results of analysis and experiments confirm it is possible for the multifunctional logic gate to optimize circuit diagnostic properties in such a way that has achieved the required circuit test parameter modification with minimum impact on the quality and credibility of these tests.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:261264 |
| Date | January 2012 |
| Creators | Stareček, Lukáš |
| Contributors | Gramatová, Elena, Kubátová, Hana, Kotásek, Zdeněk |
| Publisher | Vysoké učení technické v Brně. Fakulta informačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/doctoralThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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