Return to search

Nonlinear image processing and pattern analysis by rotating kernel transformation and optical fourier transform

No description available.

1. http://hdl.handle.net/1853/14717
2. 344291

Identifer	oai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/14717
Date	12 1900
Creators	Lee, Yim Kul
Publisher	Georgia Institute of Technology
Source Sets	Georgia Tech Electronic Thesis and Dissertation Archive
Detected Language	English
Type	Dissertation
Rights	Access restricted to authorized Georgia Tech users only.