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Hot-carrier reliability simulation in aggresively scaled MOS transistors

Thesis (Ph. D. in Electrical Engineering)--Vanderbilt University, 2003. / Title from PDF title screen. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/53886998
Date January 2003
CreatorsPagey, Manish Prabhakar.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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