A study of electron transport in the inversion layer advanced silicon carbide (SiC) power MOSFETs /

Description

Thesis (Ph. D.)--Lehigh University, 2004. / Includes vita. Includes bibliographical references (leaves 85-89).

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1. http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqdiss&rft_dat=xri:pqdiss:3147336

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Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/59226440
Date	January 2004
Creators	Zeng, Yu (Anne),
Source Sets	OCLC
Language	English
Detected Language	English
Type	Academic dissertations