Return to search

Atomic force microscopy : atomic resolution imaging and force-distance spectroscopy

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:312277
Date January 1999
CreatorsGrimble, Ralph Ashley
PublisherUniversity of Oxford
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

Page generated in 0.0018 seconds