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Precision measurements with SMI and 4PiMicroscopy

Heidelberg, Univ., Diss., 2007. / Online publiziert: 2008.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/315697538
Date January 2007
CreatorsBaddeley, David.
Publisher[S.l. : s.n.],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeOnline-Publikation.
SourceKostenfrei

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