The deals of thesis were described methods for designing safety applications, made analysis of possible microcontroller faults of long-run system, described software and hardware methods for fault detection in microcontroller and applied some March test to microcontroller. To application were chosen MATS+, PMOVI and March SS tests. These tests were modified to word-oriented memory. Further it was made analysis of modified tests to determination fault coverage, testing times and program memory requirement. To determination of fault coverage was created virtual memory with fault function models. March tests were compared with each other and with another pattern test (checkboard test).
Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:217490 |
Date | January 2008 |
Creators | Nacev, Nikola |
Contributors | Beran, Jan, Klusáček, Stanislav |
Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
Source Sets | Czech ETDs |
Language | Czech |
Detected Language | English |
Type | info:eu-repo/semantics/masterThesis |
Rights | info:eu-repo/semantics/restrictedAccess |
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