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Comparing electron and positron scattering factors for applications in diffraction and holography /

Thesis (M. Phil.)--University of Hong Kong, 1997. / Includes bibliographical references (leaf 107-108).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/51357511
Date January 1997
CreatorsMok, Cheuk-wai.
PublisherHong Kong : University of Hong Kong,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceView the Table of Contents & Abstract.

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