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Growth and characterisation of anodic oxide and sulphide films on Cd←xHg←1←-←xTe (CMT) using in-situ ellipsometry and surface second harmonic generation

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.367048

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:367048
Date	January 2000
Creators	Wark, Alastair William
Publisher	University of Strathclyde
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation