Dosimetria de elétrons em processos de irradiação com diodos resistentes a danos de radiação / Electron dosimetry in irradiation processing with rad-hard diodes

Description

Made available in DSpace on 2014-10-09T12:35:01Z (GMT). No. of bitstreams: 0 / Made available in DSpace on 2014-10-09T14:00:05Z (GMT). No. of bitstreams: 0 / Tese (Doutoramento) / IPEN/T / Instituto de Pesquisas Energeticas e Nucleares - IPEN-CNEN/SP

Links & Downloads

1. http://repositorio.ipen.br:8080/xmlui/handle/123456789/10124

Tags

DOSIMETRY

RADIATION DOSES UNITS

ELECTROMAGNETIC RADIATION

SEMICONDUCTOR DETECTORS

LI-DRIFTED SI DETECTORS

RADIATION HARDENING

SILICON DIODES

ELECTRON BEAMS

BEAM SCANNERS

ZONE MELTING

CZOCHRALSKI METHOD

EPITAXY

CRYSTAL GROWTH METHODS

Additional Fields

Identifer	oai:union.ndltd.org:IBICT/oai:10.40.40.102:123456789/10124
Date	09 October 2014
Creators	SANTOS, THAIS C. dos
Contributors	Orientador: Carmem Cecilia Bueno
Source Sets	IBICT Brazilian ETDs
Detected Language	Portuguese
Type	info:eu-repo/semantics/publishedVersion, info:eu-repo/semantics/doctoralThesis
Format	137
Source	reponame:Repositório Institucional do IPEN, instname:Instituto de Pesquisas Energéticas e Nucleares, instacron:IPEN
Coverage	N
Rights	info:eu-repo/semantics/openAccess