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Characterization of HfO2-based ReRam and the Development of a Physics Based Compact Model for the MIM Class of Memristive Devices

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1. http://rave.ohiolink.edu/etdc/view?acc_num=ucin159216930341664

Identifer	oai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:ucin159216930341664
Date	15 June 2020
Creators	Olexa, Nicholas
Publisher	University of Cincinnati / OhioLINK
Source Sets	Ohiolink ETDs
Language	English
Detected Language	English
Type	text
Source	http://rave.ohiolink.edu/etdc/view?acc_num=ucin159216930341664
Rights	unrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.