Return to search

Radiační poškození vzorků v nízkovoltové transmisní elektronové mikroskopii / Radiation damage of samples in low-voltage transmission electron microscopy

This thesis is focused on Radiation damage of samples in low-voltage transmission electron microscopy. In thesis is general description of transmission electron microscopy and their important parts. There is described how samples are damaged by primary electron beam and how samples for transmission electron microscopy are prepared and which degradation occurs from the point of view materials of sample and time dose of electrons from primary electron beam.

Identiferoai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:400992
Date January 2019
CreatorsVykydal, Václav
ContributorsValterová, Eva, Kolář, Radim
PublisherVysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií
Source SetsCzech ETDs
LanguageCzech
Detected LanguageEnglish
Typeinfo:eu-repo/semantics/masterThesis
Rightsinfo:eu-repo/semantics/restrictedAccess

Page generated in 0.0019 seconds