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Scanning Kelvin probe microscopy studies on device physics of organic field-effect transistors

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Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:709226
Date January 2015
CreatorsHu, Yuanyuan
PublisherUniversity of Cambridge
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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