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Energy Efficiency of Scratch-Pad Memory at 65 nm and Below: An Empirical Study

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Identiferoai:union.ndltd.org:NAGOYA/oai:ir.nul.nagoya-u.ac.jp:2237/12084
Date07 1900
CreatorsTakase, Hideki, Tomiyama, Hiroyuki, Zeng, Gang, Takada, Hiroaki
PublisherIEEE
Source SetsNagoya University
LanguageEnglish
Detected LanguageEnglish
TypeArticle(publisher)
RightsCopyright © 2008 IEEE. Reprinted from International Conference on Embedded Software and Systems, 2008. ICESS '08. p.93-97. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.

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