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Microscopic properties of defects in semiconductors from their vibrational spectra : H₂ in Si and C[subscript As] in Al[subscript x] Ga₁₋[subscript x]As /

Thesis (Ph. D.)--Lehigh University, 2000. / Includes vita. Includes bibliographical references (leaves 143-148).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/47647690
Date January 2000
CreatorsZhou, Jing,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeAcademic dissertations

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