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Imaging transport : optical measurements of diffusion and drift in semiconductor materials and devices /

Thesis (M.S. in Physics)--Naval Postgraduate School, Sept. 2004. / Thesis advisor(s): Nancy M. Haegel. Includes bibliographical references (p. 45). Also available online.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/57360439
Date January 2004
CreatorsFreeman, Will.
PublisherMonterey, Calif. : Springfield, Va. : Naval Postgraduate School ; Available from National Technical Information Service,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
Source(943 KB)

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