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The electrical characterisation of Si and Si/Si←1←-←XGe←X/Si structures grown by molecular beam epitaxy

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.387369

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:387369
Date	January 1993
Creators	Brighten, James Cordeaux
Publisher	University of Warwick
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation