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Evaluation of Silicon Carbide Power MOSFET Short-Circuit Ruggedness, and MMC-Based High Voltage-Step-Down Ratio Dc/Dc Conversion

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:osu1652055399185238
Date02 September 2022
CreatorsXing, Diang
PublisherThe Ohio State University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=osu1652055399185238
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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