Analysis of electrically active defects in silicon for solar cells /

Description

Zugl.: Konstanz, University, Diss., 2008.

Links & Downloads

1. http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=017538840&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA

Tags

Silicium. Gitterbaufehler.

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/644610726
Date	January 2009
Creators	Roth, Thomas.
Publisher	München : Dr. Hut,
Source Sets	OCLC
Language	English
Detected Language	English