Return to search

Development of simulation framework for the analysis of non-ideal effects in doping profile measurement using Capacitance-Voltage technique

Thesis (M.S.) -- Mississippi State University. Department of Electrical and Computer Engineering. / Title from title screen. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/80801369
Date January 2005
CreatorsKrishnan, Bharat,
PublisherMississippi State : Mississippi State University,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeElectronic resources. Electronic theses/dissertations. Master's theses.

Page generated in 0.0014 seconds