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Linearity analysis of single and double-gate silicon-on-insulator metal-oxide-semiconductor-field-effect-transistor /

Thesis (M.S.)--Ohio University, August, 2004. / Includes bibliographical references (p. 64-66).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/58476735
Date January 2004
CreatorsMa, Wei.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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