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Linearity analysis of single and double-gate silicon-on-insulator metal-oxide-semiconductor-field-effect-transistor

Thesis (M.S.)--Ohio University, August, 2004. / Title from PDF t.p. Includes bibliographical references (p. 64-66)

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/67829433
Date January 2004
CreatorsMa, Wei.
PublisherOhio : Ohio University,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceConnect to resource online

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