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Electrically active defects associated with dislocations and grain boundaries in silicon

No description available.

1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.307235

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:307235
Date	January 1995
Creators	Ayres, J. R. A.
Publisher	University of Sussex
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation