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Modeling the Complex Refractive Index of CdxZn1-xo by Spectrophotometric Characterization: An Evolutionary Approach

The complex refractive index is reported at room temperature for CdxZn1_xO thin film alloys for Cd composition up to 0.16. The CdxZn1_xO epilayers were grown by molecular-beam epitaxy on smooth ZnO/GaN/sapphire lattice templates. Transmission spectra were recorded by spectrophotometry in the 350-800nm wavelength range. The refractive index and extinction coefficient were derived by an evolutionary algorithm, which optimizes the Sellmeier and Forouhi-Bloomer dispersion models by a least-squares fitting to the experimental data.

Identiferoai:union.ndltd.org:ucf.edu/oai:stars.library.ucf.edu:honorstheses1990-2015-1670
Date01 January 2007
CreatorsFalanga, Matthew
PublisherSTARS
Source SetsUniversity of Central Florida
LanguageEnglish
Detected LanguageEnglish
Typetext
SourceHIM 1990-2015

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