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Ion bombardment induced compositional changes in compound semiconductor surfaces by XPS combined with LEISS
No description available.
Links & Downloads
http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.282997
Tags
530.41
Sputtering
Additional Fields
Identifer
oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:282997
Date
January 1995
Creators
Wei, Yu
Publisher
Aston University
Source Sets
Ethos UK
Detected Language
English
Type
Electronic Thesis or Dissertation
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