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Electrical characterization of transition metal silicide nanostructures using variable temperature scanning probe microscopy

Thesis (Ph.D.)--North Carolina State University. / Includes vita. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/183299258
Date January 2007
CreatorsTedesco, Joseph Leo,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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