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Measurement of lattice strain and relaxation effects in strained silicon using x-ray diffraction and convergent beam electron diffraction

Thesis (Ph. D.)--University of North Texas, Aug., 2007. / Title from title page display. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/191849891
Date January 2007
CreatorsDiercks, David Robert. Kaufman, Michael Joseph,
Publisher[Denton, Tex.] : University of North Texas,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
Sourceconnect to online resource.

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