Thesis: M. Eng. in Logistics, Massachusetts Institute of Technology, Supply Chain Management Program, 2016. / "June 2016." Cataloged from PDF version of thesis. / Includes bibliographical references (pages 56-57). / The unpredictable demand pattern during promotions leads to lost sales incurred due to frequent stock-outs, affecting the revenue and the brand of both the manufacturer and the retailer. The research focuses on finding out the root-causes of stock-outs in retail stores. It uses the audit response data that informs us of various states for zero on-shelf availability. These responses are used to create a fault-tree diagram that shows how different states could be reached. The root-causes mentioned in the fault-tree diagram are classified as either qualitative or quantitative root-causes. The credibility of quantitative root causes was established through regression analysis while store visits and interviews of different players of the supply chain helped to reason out the qualitative root-causes. Quantitative factors such as replenishment frequency, store sales volume and forecast accuracy seem to indicate a good correlation with stock-outs during promotions. / by Alankrita Nigam. / M. Eng. in Logistics
| Identifer | oai:union.ndltd.org:MIT/oai:dspace.mit.edu:1721.1/107513 |
| Date | January 2016 |
| Creators | Nigam, Alankrita |
| Contributors | Daniel Steeneck., Massachusetts Institute of Technology. Engineering Systems Division., Massachusetts Institute of Technology. Supply Chain Management Program., Massachusetts Institute of Technology. Engineering Systems Division. |
| Publisher | Massachusetts Institute of Technology |
| Source Sets | M.I.T. Theses and Dissertation |
| Language | English |
| Detected Language | English |
| Type | Thesis |
| Format | 59 pages, application/pdf |
| Rights | MIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission., http://dspace.mit.edu/handle/1721.1/7582 |
Page generated in 0.0093 seconds