Stress evolution during Volmer-Weber thin film growth : a multi-scale approach for modeling diffusion, cohesion and attachment.

Description

Thesis (Ph.D.)--Brown University, 2008. / Vita. Advisor: Allan Bower. Includes bibliographical references (leaves 77-80).

Links & Downloads

1. http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqdiss&rft_dat=xri:pqdiss:3318363

Tags

Thin films. Mechanical engineering.

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/549751903
Date	January 2008
Creators	Tello, Juan S.
Source Sets	OCLC
Language	English
Detected Language	English
Source	View abstract/electronic edition; access limited to Brown University users