by KE Ning. / Thesis (Ph.D.)--Chinese University of Hong Kong, 1996. / Includes bibliographical references (leaves 127-134). / ACKNOWLEDGMENT --- p.a1 / ABSTRACT --- p.a2 / CONTENTS --- p.a3 / LIST OF FIGURE --- p.a6 / LIST OF TABLE --- p.a10 / Chapter CHAPTER 1 --- Introduction / Chapter 1.1 --- Overview of Some Carbon-Based Materials --- p.1 / Chapter 1.2 --- Diamond-Like Carbon (DLC) Thin Films --- p.3 / Chapter 1.2.1 --- Introduction --- p.3 / Chapter 1.2.2 --- Applications of DLC films --- p.9 / Chapter 1.2.3 --- The role of hydrogen --- p.10 / Chapter 1.2.4 --- The role of fluorine and the scope of this work --- p.13 / Chapter 1.3 --- Fullerenes --- p.17 / Chapter 1.3.1 --- Introduction --- p.17 / Chapter 1.3.2 --- Applications --- p.20 / Chapter 1.3.3 --- "The oxygen effect, the metal doping effect and the Scope of this study" --- p.23 / Chapter 1.4 --- Organization of This Thesis --- p.26 / Chapter CHAPTER 2 --- Experimental --- p.27 / Chapter 2.1 --- Samples Preparation and Thin Films Deposition --- p.27 / Chapter 2.1.1 --- Hydrogenated amorphous carbon thin film --- p.27 / Chapter 2.1.2 --- The fullerenes and C60 synthesis --- p.30 / Chapter 2.1.3 --- C60 thin film deposition --- p.34 / Chapter 2.2 --- Modification --- p.35 / Chapter 2.2.1 --- Ion implantation of a-C:H films --- p.35 / Chapter 2.2.2. --- C60doping --- p.39 / Chapter 2.3 --- Characterization Methods --- p.41 / Chapter 2.3.1 --- Electrical measurement --- p.41 / Chapter 2.3.2 --- High electric field measurement --- p.42 / Chapter 2.3.3 --- Electron Spin Resonance (ESR) --- p.43 / Chapter 2.3.4 --- Photoluminescence (PL) --- p.47 / Chapter 2.3.5 --- Photothermal Deflection Spectroscopy (PDS) --- p.48 / Chapter 2.3.6 --- Fourier Transform Infrared Spectrometry (FTIR) --- p.53 / Chapter 2.3.7 --- Mass Spectrum --- p.53 / Chapter CHAPTER 3 --- Characterization of the Fluorine implanted a-C:H Thin Films --- p.54 / Chapter 3.1 --- ESR Results --- p.55 / Chapter 3.2 --- Secondary Ion Mass Spectroscopy (SIMS) Measurement --- p.59 / Chapter 3.3 --- Electrical Properties --- p.61 / Chapter 3.4 --- Optical Properties --- p.65 / Chapter 3.4.1 --- PL Spectrum studies of fluorine implanted a-C:H films --- p.65 / Chapter 3.4.2 --- PDS Studies of fluorine implanted a-C:H films --- p.69 / Chapter 3.5 --- Nonlinear Transport Properties at High Fields --- p.76 / Chapter CHAPTER 4 --- Characterization of C60 Thin Films --- p.89 / Chapter 4.1 --- Effect of Oxygen on C60 Materials-The Stability Studies of C60 Films --- p.89 / Chapter 4.1.1 --- Defect studies-ESR measurements --- p.90 / Chapter 4.1.2 --- Structure studies of FTIR and Mass Spectrum measurements --- p.97 / Chapter 4.2 --- A Study of The Properties of Sn Doped C60 Films --- p.106 / Chapter 4.2.1 --- Surface Morphology --- p.107 / Chapter 4.2.2 --- The electrical and defect properties --- p.107 / Chapter 4.2.3 --- Optical study --- p.116 / Chapter 4.2.4 --- Structure analysis´ؤmass spectrum --- p.118 / Chapter CHAPTER 5 --- Conclusion --- p.121 / Chapter 5.1 --- Hydrogenated Amorphous Carbon --- p.121 / Chapter 5.2 --- Fullerene- C60 --- p.123 / Chapter CHAPTER 6 --- Future Works / Chapter 6.1 --- Amorphous Carbon Films --- p.125 / Chapter 6.2 --- C60 Materials --- p.125 / REFERENCES --- p.127 / APPENDIX / Chapter 1 --- ESR Results of Fluorine Implanted a-C:H Films --- p.i / Chapter 2 --- Publications --- p.ii
| Identifer | oai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_321647 |
| Date | January 1996 |
| Contributors | Ke, Ning., Chinese University of Hong Kong Graduate School. Division of Electronic Engineering. |
| Publisher | Chinese University of Hong Kong |
| Source Sets | The Chinese University of Hong Kong |
| Language | English |
| Detected Language | English |
| Type | Text, bibliography |
| Format | print, a10, 134, [2] leaves : ill. ; 30 cm. |
| Rights | Use of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/) |
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