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Contact resistance and stability analysis of oxide-based thin film transistors /

Thesis (M.S.)--Oregon State University, 2007. / Printout. Includes bibliographical references (leaves 90-92). Also available on the World Wide Web.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/74281963
Date January 1900
CreatorsHung, Celia M.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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