This thesis explores the theory describing wavefunctions and images, both elastic and inelastic, formed in scanning transmission electron microscopy. / A method is presented for calculating the elastic wavefunction based upon a new formulation of the boundary conditions which couples the probe to Bloch states within the crystal in a single step. Though this method is fundamentally equivalent to previous approaches based upon the superposition of wavefunctions corresponding to individual plane wave components in the incident probe, it provides new insight into the some of the dynamics, allows for efficient calculations, and proves useful for demonstrating well known results such as reciprocity relations. A formal inversion technique is also presented that uses a collection of diffraction plane data in scanning transmission electron microscopy to reconstruct the object potential, even in the presence of strong multiple scattering. / The new form of the boundary conditions allows for a generalization of a crosssection expression for calculating inelastic images, making use of the theory of mixed dynamic form factors. This enables the simulation of images for a range of inelastic mechanisms, including thermal scattering, used to simulate high-angle annular dark field imaging, and inner-shell ionization, used to simulate electron energy loss spectroscopy images. A multislice form of this expression is given. Selection between the methods can thus be based on the sample of interest: the Bloch wave method is very efficient when the sample is crystalline; the multislice method is more appropriate if the sample lacks periodicity. / The issue of cross-talk, where dynamical probe spreading may result in a signal containing contributions from several columns and therefore confound direct interpretation, is assessed for high-angle annular dark field imaging. Single atom images are simulated to provide an estimate of the localization of signal in electron energy loss spectroscopy, and confirm that the limitations of probe size generally outweigh those of the nature of the ionization interaction. The feasibility of column-by-column spectroscopic identification is demonstrated through a combination of experimental data and supporting calculations. Data demonstrating the location and spectroscopic identification of a single impurity atom in the bulk are supported by simulation and it is demonstrated that a quantitative comparison can offer further useful information: an estimate for the depth of the impurity. / The contribution to electron energy loss spectroscopy images from electrons which have undergone thermal scattering prior to causing an inner-shell ionization event is assessed. It is concluded that this contribution is significant in strongly scattering specimens imaged using fine probes. It will be necessary to include this contribution if quantitative comparisons are to be made.
| Identifer | oai:union.ndltd.org:ADTP/245479 |
| Creators | Findlay, Scott David |
| Source Sets | Australiasian Digital Theses Program |
| Language | English |
| Detected Language | English |
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