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Microstructural investigation of defects in epitaxial GaAs grown on mismatched Ge and SiGe/Si substrates

Thesis (Ph. D.)--Ohio State University, 2005. / Title from first page of PDF file. Document formatted into pages; contains xxii, 212 p.; also includes graphics. Includes bibliographical references (p. 203-212). Available online via OhioLINK's ETD Center

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/62093534
Date January 2005
CreatorsBoeckl John J.,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceConnect to this title online

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