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Charge trapping instabilities in amorphous silicon/silicon nitride thin film transistors

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.381605

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:381605
Date	January 1988
Creators	Hepburn, A. R.
Publisher	Open University
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation