Our major work is to use LabVIEW as the platform to develop the instrument control programs for measuring the optical and electrical properties of semiconductor materials.
To measure the optical properties of semiconductor materials, we developed an optical spectroscopy control program. The program can be modified to make it suitable for many kinds of optical spectroscopy systems. Here we use it to measure the transmission spectrum of GaNP bulk material.
To measure the electrical properties of semiconductor materials, we developed a program to record the I-V characteristic curve of the device under test. We can use it to check the ohmic property of contact form between metal electrode and semiconductor material. Finally, we developed a program to record the photoconductivity build-up and decay transient curve.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0909107-072456 |
| Date | 09 September 2007 |
| Creators | Lai, Chun-chen |
| Contributors | Wei-hung Su, Chao-yi Tai, Da-ren Hang |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0909107-072456 |
| Rights | unrestricted, Copyright information available at source archive |
Page generated in 0.0016 seconds