Characterization of process-related defects in silicon carbide by electron microscopy /

Description

Diss. (sammanfattning) Linköping : Univ., 2001. / Härtill 7 uppsatser.

Links & Downloads

1. http://www.bibl.liu.se/liupubl/disp/disp2001/tek695s.pdf

Tags

Tunnfilmsteknik.

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/186266279
Date	January 1900
Creators	Persson, Per O. Å.,
Publisher	Linköping : Univ.,
Source Sets	OCLC
Language	English
Detected Language	English
Source	Sammanfattning på engelska (spikblad)