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The electrical properties of vanadium oxide films.

Thesis--M. Phil., University of Hong Kong.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/52013868
Date January 1978
CreatorsLi, Wing, Andy,
Publisher[Hong Kong] : University of Hong Kong,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceView the Table of Contents & Abstract.

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