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Behavioral delay fault modeling and test generation /

Thesis (M.S.)--Virginia Polytechnic Institute and State University, 1994. / Vita. Abstract. Includes bibliographical references (leaves 165-169). Also available via the Internet.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/31047624
Date January 1994
CreatorsJoshi, Anand Mukund,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceThis resource online

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