A newly designed setup to perform steady-state X-ray excited optical
luminescence (XEOL) spectroscopy and simultaneous XEOL and X-ray
absorption spectroscopy characterization at beamline P65 of PETRA III is
described. The XEOL setup is equipped with a He-flow cryostat and state-ofthe-
art optical detection system, which covers a wide wavelength range of 300–
1700 nm with a high spectral resolution of 0.4 nm. To demonstrate the setup
functioning, low-temperature XEOL studies on polycrystalline CuInSe2
thin film, single-crystalline GaN thin film and single-crystalline ZnO bulk
semiconductor samples are performed.
| Identifer | oai:union.ndltd.org:DRESDEN/oai:qucosa:de:qucosa:92832 |
| Date | 30 July 2024 |
| Creators | Levcenko, S., Biller, R., Pfeiffelmann, T., Ritter, K., Falk, H. H., Wang, T., Siebentritt, S., Welter, E., Schnohr, C. S. |
| Publisher | IUCr |
| Source Sets | Hochschulschriftenserver (HSSS) der SLUB Dresden |
| Language | English |
| Detected Language | English |
| Type | info:eu-repo/semantics/publishedVersion, doc-type:article, info:eu-repo/semantics/article, doc-type:Text |
| Rights | info:eu-repo/semantics/openAccess |
| Relation | 1600-5775, 10.1107/S1600577522007287 |
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