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Growth and characterization of electrodeposited zinc sulphide and chemical vapour atomic layer deposited zinc oxide, sulphide, and oxysulphide thin films.

Thesis (Ph.D.)--McMaster University (Canada), 1991. / Source: Dissertation Abstracts International, Volume: 54-02, Section: B, page: 1040.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/181817860
CreatorsSanders, Brian Wayne. Kitai, A.H.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
Source*McMaster only

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