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Insights into Texture and Phase Coexistence in Polycrystalline and Polyphasic Ferroelectric HfO2 Thin Films using 4D-STEM

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Identiferoai:union.ndltd.org:DRESDEN/oai:qucosa:de:qucosa:78788
Date11 April 2022
CreatorsGrimley, Everett D., Frisone, Sam, Schenk, Tony, Park, Min Hyuk, Mikolajick, Thomas, Fancher, Chris M., Jones, Jacob L., Schroeder, Uwe, LeBeau, James M.
PublisherCambridge University Press
Source SetsHochschulschriftenserver (HSSS) der SLUB Dresden
LanguageEnglish
Detected LanguageEnglish
Typeinfo:eu-repo/semantics/acceptedVersion, doc-type:article, info:eu-repo/semantics/article, doc-type:Text
Rightsinfo:eu-repo/semantics/openAccess
Relation1878-4291, 10.1017/S1431927618001411

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