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Effect of rate-limited interfacial tension reductions on the displacement of residual NAPLs during surfactant flushing

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Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/19280
Date12 1900
CreatorsLoverde, Laura Elizabeth
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Detected LanguageEnglish
TypeThesis
RightsAccess restricted to authorized Georgia Tech users only.

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