Return to search

An application of fault tree analysis to operational testing

No description available.
Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/24583
Date08 1900
CreatorsRankin, Gordon Lee
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Detected LanguageEnglish
TypeThesis
RightsAccess restricted to authorized Georgia Tech users only.

Page generated in 0.002 seconds